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SCL-VI: Self-supervised Context Learning for Visual Inspection of Industrial Defects

<a href="https://arxiv.org/abs/2311.06504"><img src="https://img.shields.io/badge/arXiv-2311.06504-b31b1b.svg" height=22.5></a> <a href="https://opensource.org/licenses/MIT"><img src="https://img.shields.io/github/license/WU-CVGL/BAD-NeRF" height=22.5></a>

We address the challenge of detecting object defects through the self-supervised learning approach of solving the jigsaw puzzle problem.

Results

segmentation

Dependencies

Since I did this project a long time ago, there may be some potential issues with environmental dependencies.

Dateset

Run Training

Run Affinity Testing

Anomaly maps

Details: