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CologneChip GateMate FPGA Module: GMM-7550

January 2024 Update

The project repositories are moved to a dedicated account. Please, update your references to https://github.com/gmm-7550/ to follow further development.

June 2022 Update After more than two years of development and delays the module and adapter boards are out of production.

Tests are underway, no problems discovered so far, updates are expected in a few weeks.

This project is licensed under CERN-OHL-P v2

Current module revision is 2.1 -- it is updated to the latest (flip-chip) GateMate FPGA pin out. The other changes are complete redesigns of the power and clock subsystems due to component availability.

Assembled modules

Schematic (pdf) version 2.1

40-pin GPIO (R-Pi HAT) Adapter for GMM-7550 Module

The adapter board provides power to the GMM-7550 module (5V from 40-pin GPIO or from an external connector), I2C and SPI interfaces, control over the module power enable and reset signals and module power consumption monitoring.

Two 12-pin Pmod extension connectors are routed to the GateMate FPGA South GPIO pins through 2.5/3.3 bi-directional level converter.

Assembled 40-pin adapter board

Schematic (pdf) version 1.1

Memory Extension Module

The module provides 512Kx8 static RAM (CY7C1049GN30-10ZSXI) with 10 ns access time and 16 MiB QSPI NOR FLASH (S25LP128-JBLE). The module may be connected to P1, P2 or P3 connector of the GMM-7550, up to three modules may be connected simultaneously. An SPI Bridge example design for FPGA routes SPI from a host (R-Pi or VisionFive board) to the module connector and allows to access the SPI NOR chip on the module from the host. The module control software provides commands to automate the FPGA configuration and access to the SPI on the extension module.

Memory module

Schematic (pdf) version 1.0

Test and Demo System based on VisionFive RISC-V SBC

The SBC runs buildroot embedded Linux, experimental configuration for the VisionFive board is available as a buildroot-external tree.

VisionFive SBC and modules for the test system